Multivariate analysis of PIXE + XRF and PIXE spectral images
نویسندگان
چکیده
Multivariate t-SNE analysis enables pixel identification with similar X-ray spectra for layer thickness determination and calculation of elemental concentrations.
منابع مشابه
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ژورنال
عنوان ژورنال: Journal of Analytical Atomic Spectrometry
سال: 2021
ISSN: ['1364-5544', '0267-9477']
DOI: https://doi.org/10.1039/d0ja00529k